LEI 1600 serials

  • BRAND: Lehighton
  • DESCRIPTION: Measured the sheet resistance of the Si wafer and compund semiconductor
  • Nation of Principal:U.S.A
    Product Application
    semiconductor, Compound semiconductor, solar cell

    Related Linkhttp://www.lehighton.com

1.  Non-contact measurement 
> Carrier Mobility
> Carrier Density
> Carrier Concentration
> sheet resistivity
2.  2"~8" wafers and flat panel
3.  GaAs, GaN, SiGe, InP, Si, etc.
4.  Semi-auto or filly automatical
5.  Time saving:
> no need to cut the sample
> no need to connecting conducting wire
6.  Measurement under room temp
7. Good repeatability