CHALLENTECH INTERNATIONAL (SHANGHAI) CORPORATION

PIDcon PID test for Solar cell

MDPinline ingot Measure carrier lifetime of monocrystalline/multicrystalline silicon bricks and wafers.

MDPinline 1. Inline mapping one wafer less than one second. 2. wafer classification based on lifetime data. ..

MDPmap 1. Offline mapping less than 5 minute. 2. wafer classification based on lifetime data 3. lifetime..

MDPlinescan 1.Flexible OEM unit for lifetime measurements 2.Standard software interface for easy connection to..

MDPingot 1. Resolution reach to 0.5mm 2. Ingot mesurement length is 500mm Max. 3. Auto mark cutting line re..